X-ray powder diffraction (XRPD) is a powerful tool for the study of (partially) crystalline materials. Each crystalline material shows a distinct X-ray diffraction pattern due to the differences in the crystalline lattice parameters, different atom types and/or different packing of molecules.
Using diverse types of geometries (reflection or transmission) or sample stages (eg. humidity chamber, capillary spinner) the XRD scientist has a variety of analytical tools to find the best measurement conditions to answer specific questions.
Solvias offers a broad range of different X-ray powder diffraction techniques in combination with a long experience in analysis of API’s.
Certification
- ISO 9001, SQS 11237-04
- GMP Compliance
XRPD instruments:
| Model | Geometry | Stages | Detector |
| Bruker D8 Advance | Reflection | Spinner | LynxEye |
| STOE Stadi P | Reflection/Transmission | Spinner, Capillary spinner | Mythen 1K |
| PANalytical X’Pert PRO-MPD* | Reflection/Transmission | Well plates, TTK with temperature and humidity control | Pixcel Detector |
*ISO measurements only
XRPD applications:
- Analysis of Solids and Powders
- Analysis of highly active samples in safety cell on the Stoe instrument in transmission mode (up to Safebridge class OEB 3, OEB 4 on request)
- Temperature and humidity dependent XRPD studies in order to elucidate the stability of polymorphs or hydrates
- Transmission geometry, capillary spinner: best suited for high resolution analysis, structure solution, polymorph identification and indexing
- Reflection geometry: also suited for the estimation of amorphous contents
- High-throughput diffraction analysis of micro titre well plates
- Indexing of XRPD pattern can help to determine whether the analyzed sample represents a pure phase. Indexing is also a first step towards the structure solution out of powder diffraction data
- Calculated powder pattern from single crystal data (provided by customer) can be compared with experimental pattern. Solvias uses several programs to calculate XRPD pattern
- Rietveld refinement can be applied to quantify different crystalline components of mixtures which show a high degree of peak overlap. Prerequisite: the crystal structures of the components must be known
XRPD software:
- Diffrac Suite (GMP/ISO), Bruker AXS, Germany
- HighScore Plus (GMP/ISO), PANalytical, The Netherlands
- WinXPOW (GMP/ISO), Stoe & Cie, Germany
- Diamand 3.2, Crystal Impact, Germany
- The raw data can be supplied in all major X-ray file formats independent of the instrument used. In addition data can be supplied as Excel graph linked to a sheet containing all x-y data points
Additional Services / Features:
- Method development and validation under GMP
- Examination of patent infringements
- The XRPD lab is embedded in the solid-state development department, a department with experts on polymorphism, co-crystals, salts and crystallization development